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High-speed XRF Analyzer SEA6000VX SIINT+Carl Zeiss Jointly Developed FIB-SEM EXSTAR X-DSC7000 for Ultimate Performance
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06/08/2010 new SII NanoTechnology Newly Releases High Sensitivity Differential Scanning Calorimeter X-DSC7000
03/15/2010 new SII NanoTechnology Newly Releases XRF Coating Thickness Gauge SFT-110
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04/17/2009 Announcement of Corporate Headquarters Relocation
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