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:: Information :: |
| July 1, 2005 |
Releases gNonoNavih Station, a Control Station for Scanning Probe Microscopes
High-Resolution and High-Precision Measurements Enabled by SIS-mode and Closed Loop Scanner
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On August 1, SII NanoTechnology Inc. will start shipment
of gNanoNavih Station, a new probe station that controls
scanning probe microscope (SPM) systems.
SPM is a system that detects various physical quantities,
such as interatomic forces, hardness, electricity and
magnetic forces based on a resonated microscopic probe
(a needle-like probe). It enables observation and mapping
of the shape and physical property of a sample surface
at nano-level. When it comes to observing shapes and
physical properties at nanometer order or less, SPM
is in the spotlight as an alternative to a scanning
electron microscope (SEM), and used as an essential
instrument for assessment and processing of thin-film
or material, in the field of nanotechnology research.
SII NanoTechnology began its research and development
of SPM in 1985. With more than 20 years of experience
in SPM system research and development, SII NanoTechnology
is a leading company that released Japanfs first scanning
tunneling microscope (STM) in 1987, and a manufacturer
of comprehensive scanning probe microscopes, with a
various lineup that satisfies diverse measurement needs.
gNanoNavih Station, made public this time, was developed
based on the technology and knowledge SII NanoTechnology
has acquired over these years. As a new probe station,
it can control various units made by SII NanoTechnology.
Also, its compatibility allows upgrading existing stations,
which opens doors to the latest functions such as closed-loop
scanner and SIS mode (*1), while saving the implementation
cost.
As a core of the system control, gNanoNavih Station
will be the center of SII NanoTechnologyfs SPM product
development, aiming at brand integration of the SPM
products as the gNanoNavi series.h
[NanoNavi Station Main Features]
• Ease of use enabled by measurement navigation
functions.
• Automatic multi-point measurement and analysis
functions
• Unique scanning method (SIS-mode) that achieves
the measurement of deep or narrow grooves of high aspect
ratios, and less cantilever wear
• A closed-loop-scanner function that brought
a significant precision improvement in the field of
minute measurement and processing
[Price] 8,500,000 yen
[Sale Start Date] August 1, 2005
*1 SIS (Sampling Intelligent Scan) mode:
The scan mode in which the probe approaches to the sample
only while acquiring data. By combining this scan mode
and carbon nano-probe, high aspect surface shape can
be accurately measured. Excellent in probe wear durance.
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