Seiko Instruments Inc.
Seach HOMEJAPANESEChinese
Whats New? Events Products Technology Distribution Channel Corporate Information Contact Us
News Release
News Release
:: News Release ::
June 17, 2008

Launch of the SEA6000VX Fluorescent X-ray Analyzer equipped with High-Speed Mapping Measurement Function

Improved Efficiency of Hazardous Metal Testing in Micro-spot via High Sensitivity and High-speed Measurement

Today, SII NanoTechnology Inc. has released the SEA6000VX, an energy dispersive fluorescent X-ray Analyzer for high-speed, high sensitivity measuring of traces of metal in micro-spot which does not require liquid nitrogen.

The fluorescent X-ray analyzer, praised for its measurement speed and easy use, has been widely introduced as an incoming and outgoing inspection instrument which helps decide whether components and products comply with environmental regulations such as RoHS Directive. With environmental directives such as ELV as well as RoHS, along with trends toward lead-free and halogen-free in toys and RPF*1, the need for measurement of environmentally regulated substances continues to spread. There are, however, strong practical needs for further improvement of measurement efficiency and solutions for complicated measurements. Requirements for measurement of composite components including assembled printed circuit boards that could not be met by conventional devices, such as measurement of micro-spot on specific parts without disassembling components and management of harmful substances over the entire board, have become apparent, raising demand for development of devices that can satisfy such needs.

The SEA6000VX is an instrument that enables high speed measurement of micro-spots with considerable improvement in sensitivity. Equipped with our unique Vortex, a liquid nitrogen-free semiconductor detector with high count rate, and a new X-ray generating system design, the SEA6000VX boasts improved sensitivity on the order of 10 times or greater than of conventional models. As such, measurements of trace hazardous substances conventionally conducted in relatively large analytical areas (about 5 - 10mm) can now be conducted in much smaller areas (about 0.5 - 1.2mm) in the same measurement time or less.
The combination of the improvement of sensitivity in the micro-spot and a high-speed electric stage has enabled high speed two-dimensional elemental mapping. High-speed mapping of the 100mm x 100mm assembled printed circuit board allows detection of eutectic solder of sub-millimeter size in approximately two minutes. Furthermore, increasing the frequency of mapping allows lead detection at 1,000 ppm level, which is the regulated value stipulated by the RoHS directive, in approximately 30 minutes. It can now be determined whether the entire assembled printed circuit board is lead-free.
In addition, operability and improvement in measurement stability has been achieved by equipping an optical system that allows observation in a wide, high-resolution visual field in order to locate the measurement site as well as by installing a high accuracy X-Y stage.

Through the addition of the surface exposure type SEA6000VX to the conventional undersurface exposure type SEA1000A and SEA1200VX, SII NanoTechnology's hazardous substance measuring fluorescent X-ray analyzers have become a product lineup that can handle a variety of measurement targets.


[Main Features]

1. High-Speed Mapping Measurement
The combination of significantly improved sensitivity of micro-spot fluorescent X-ray analysis and continuous high-speed electric stage activation enables high-speed, two-dimensional elemental mapping images. Special filters for lead mapping in particular have been added to strengthen compliance with lead mapping in the board. It is also possible to map quantities of lead even less than 1,000 ppm located in the lead-free solder.

2. High Resolution, Wide Area Optical System
A high resolution optical image of 20 micrometers or less can be acquired over an area of 250mm x 200mm. The location of measurement can be specified directly from this optical image with a high level of accuracy, resulting in dramatically improved operability. Additionally, overlapping the optical image with the mapping image obtained by high-speed mapping enables highly accurate analysis over a wide area.

3. High-speed Measurement of Trace Metal in Micro Spot
High sensitivity is possible through the high-density micro X-ray beam, on-board detector with a high count rate, and design that employs the detection efficiency of a fluorescent X-ray. The trace metals in the micro-spots and thin film can be measured in a short time. Hazardous substances in a 1mm x 1mm area can be measured in approximately 100 seconds.

4. High Count Rate Detector not Requiring Liquid Nitrogen
Comes standard equipped with SII NanoTechnology's unique High Count Rate Detector Vortex, for which the hassle of liquid nitrogen supply is unnecessary. Additionally, start-up time is as short as several minutes, and, as it is a thermoelectric cooling type, it is highly reliable. The device is very environmentally friendly thanks to reduced power consumption owing to increased measurement speed efficiency, reduced carbon dioxide generation during manufacturing and transportation of liquid nitrogen, and other factors.

5. Measurement of Film Thickness in Micro-spots
It is possible to measure the thickness of a thin film composite plating of Au/Ni/Cu (gold/nickel/copper) with an area of 0.2mm x 0.2mm with high accuracy in approximately 10 seconds. In addition, trace amounts lead contained in lead-free solder plating and electroless nickel plating can also be analyzed.


[Main Specifications]
X-ray Tube: Tube Voltage:50 kV, Current: 1mA
Detector: Semiconductor detector (liquid nitrogen-free)
Beam Diameter: 0.2x0.2mm, 0.5x0.5mm, 1.2x1.2mm, 3x3mm: automatic switching
Sample Observation: High resolution CCD camera (Dual system)
Maximum Sample Size: 580 (W) x 450 (D) x 150 (H) mm
Filter: Electric power switching (primary: 6 positions)
X-ray Station: Personal computer; 19-inch LCD monitor
Options: Joystick Controller, Signal Tower, Multi Display and other
Data processing: Microsoft® Excel and Microsoft Word® installed
Safety functions: Interlocking sample chamber door, sample collision prevention mechanism and device diagnostic mechanism


[Price]
18,000,000 yen (Standard specification, tax excluded)


[Sales Target]
20 units in FY 2008


[Sales Start Date]
June 17, 2008

XRF Analyzer SEA6000VX
Fluorescent X-ray Analyzer SEA6000VX


[Note]
*1 RPF : Abbreviation for gRefuse Paper & Plastic Fuelh, which is refers to solid fuel made mainly of used paper and waste plastic that is difficult to recycle.

Microsoft, Encarta, MSN, and Windows are either registered trademarks or trademarks of Microsoft Corporation in the United States and/or other countries.


Inquiries

[Press Contact]
Corporate Communications Group

[Product Inquiry]
International Sales and Marketing Department

Online inquiry

 

BackBack
SII HOME
• Privacy Policy   • Site Map
Copyright © 2008 SII NanoTechnology Inc. All Rights Reserved.