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NanoTechnology Inc. is a solutions company that assists
manufacturing industries in key processes including development,
production and inspection. We offer solutions that meet
your needs in analysis, measurement and observation. |
Thermal Analysis |
EXSTAR6000 is the thermal analysis system with excellent sensitivity, extensibility, and ease of operation.
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Scanning Probe Microscope |
New Product: NanoNavi Station is now available! Realizing ultimate measurement performance and best-suited for high aspect samples.
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Focused Ion Beam / Scanning Ion Microscope |
Wide varieties of FIB systems supporting high resolution observation and microfabrication in R&D and electronic devices inspection.
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ICP-OES/ICP-MS |
Various product lineup of ICP-OES and ICP-MS. Support diversified needs in element analysis by its high sensitivity and ease of operation.
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Device Observation/Photomask Repair |
Lineup of cutting edge mask repair systems realizing highly accurate repair in the latest generation electronic devices.
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XRF Analysis |
Lineup of XRF analyzers, commanding attention in use in environmental field. WEEE&RoHS, ELV compliant types and soil investigation type are also available.
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XRF Coating Thickness Gauge |
Lineup of SFT9000 series, covering standard type to high-grade type with dual-detector.
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Transmission Electron Microscope/Scanning Electron Microscope |
Lineup of high-grade TEM and SEM developed with cutting edge technology.
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Mask Data Preparation Software |
Lineup of software achieving cost and time reduction in handling semiconductor photomask data.
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X-ray Detector |
Sillicon
multi-cathode detectors and spectrometers
for fluorescent X-ray and scanning electron
microscopes, featuring LN2 free, high resolution
and high count rate.
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Pre-clinical Imaging system |
The world's first pre-clinical imaging system by Gamma Medica-Ideas that integrat PET, SPECT and CT.
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