Seiko Instruments Inc.
Seach HOMEJAPANESEChinese
Whats New? Events Products Technology Distribution Channel Corporate Information Contact Us
Products
Product Lineup
Thermal Analysis (DSC, TG, DTA, TMA, DMA)
Scanning Probe Microscope (SPM)
Focused Ion Beam (FIB) / Scanning Ion Microscope (SIM)
ICP-OES(ICP-AES). ICP-MS
Photomask Repair
XRF Analysis
XRF Coating Thickness Measurements
Transmission Electron Microscope/Scanning Electron Microscope / Scanning Electron Microscope (TEM/SEM)
Mask Data Preparation Software (MDP)
X-ray Detector
Pre-Clinical Imaging System (CT-PET-SPECT)
Price Inquiry
Price Inquiry Form
Supplies Price Chart
Technology
Distribution Channel
Testing Laboratories

 Mask Data Preparation Software (MDP)

 Total 3 Products 

SmartMRC SmartMRC
Mask Rule Checker
SmartMRC contributes to the yield improvement of the mask
and shortening the mask manufacturing and the inspection time.

SmartMRC Mask Rule Checker

 

SmartOASIS SmartOASIS
Mask Data Preparation Software
Increase in time for handling and transitioning data, and storage of large volumetric data are becoming serious problems. SmartOASIS that enables data transition from GDS format to OASIS format and check of the transitioned data, resolves problems related to increase of data volume.

SmartOASIS Mask Data Preparation Software

 

Hotscope HOTSCOPE
Mask Data Preparation Software
HOTSCOPE is an excellent data browser, displaying huge-sized layout data and photomask data quickly and precisely regardless of its view magnification. This high-performance data browser improves efficiency in checking dramatically increasing LSI data.

HOTSCOPE Mask Data Preparation Software

Developed byFDNP Dai Nippon Printing

 
SII HOME
• Privacy Policy   • Site Map
Copyright © 2008 SII NanoTechnology Inc. All Rights Reserved.