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Thermal Analysis (DSC, TG, DTA, TMA, DMA)
Scanning Probe Microscope (SPM)
Focused Ion Beam (FIB) / Scanning Ion Microscope (SIM)
ICP-OES(ICP-AES). ICP-MS
Photomask Repair
XRF Analysis
XRF Coating Thickness Measurements
Transmission Electron Microscope/Scanning Electron Microscope / Scanning Electron Microscope (TEM/SEM)
Mask Data Preparation Software (MDP)
X-ray Detector
Pre-Clinical Imaging System (CT-PET-SPECT)
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Testing Laboratories

XRF Analysis
(WEEE/RoHS/ELV Compliant)

Total 4 Products 

SEA200 SEA1200VX
High Sensitivity Element Monitor
Improved sensitivity is realized by installing a highly sensitive, high resolution detector to handle all types of analysis from RoHS/ELV screening to advanced types of analysis.
SEA1200VX

SEA200 SEA1000A
Hazardous Substance Monitor
SEA1000A is a dedicated machine that easily, quickly and non-destructively detects cadmium, lead, mercury and other hazardous substances banned by the enforcement of the RoHS directive. Since a detector needs no liquid nitrogen is installed in this device, it does not require the hassles of periodic refilling, and operates simply with electric power in plants where liquid nitrogen may be in short supply.
SEA1000A

SEA2200A Series SEA2200A Series
Hazardous Substance Monitor
In accordance with the European Union's issuance of RoHS directive in February 2003, the use of cadmium, lead and other hazardous substances in electric/electronic appliances will be banned beginning July 2006. In response, makers of export goods must conduct stricter inspections as well as start the designing of compliant goods at an early date. SEA2200A is standard equipped with a compensation software that minimizes effects of the measurement sample's shape, thickness and composition, and as it can quickly and make measurements without preparing samples such as cadmium, lead and other hazardous substances in plastic products, it is useful for inspecting large volumes of goods.
SEA2200A Series

SEA5100/5200 SEA5120A
Micro Element Monitor
This series is XRF element monitor for qualitative analysis and simultaneous quantitative analysis of various elements in 50 µm level area. Type A, equipped with X-ray filter, is capable of measuring such hazardous substances as Cd and Pb restricted by WEEE & RoHS directives with high sensitivity. A CCD microscope and XYZ automatic stage are equipped, enabling analysis of submicroscopic area and display and print a mapping image of measured concentration of element. Also, it is equipped with functions such as extraneous substance checking and coating thickness measurement.
SEA5100A, SEA5100/5200 Micro Element Monitor

 

ICP-OES
( WEEE/RoHS/ELV Compliant)

Total 2 Products 

SPS7800 Series SPS7800 Series
Bench-top Optical Emission Spectrophotometer
A bench-top plasma emission spectrometer developed on the basis of new ICP technology with emphasis on affordable price and easy operation. Adoption of double monochromator and echelle grating as a dispersive device, has made it possible to meet wide range of needs to measure various samples with high resolution comparable to large size spectrometers.
SPS7800 Series

SPS3100 Series SPS3100 Series
ICP Optical Emission Spectrometer
To respond to diversifying needs including resolution, throughput, precision and others, each unit has been modularized, simplifying the selection of system construction. In addition, with the miniaturization of the device, the installation space can be used more effectively with this next generation system ICP optical emission spectrometer.
SPS3100 Series


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